Abstract
The two-dimensional plasmon of an $n$ inversion layer of (100) $p$-type Si is observed at a fixed wave vector as a function of electron density. The position, width, and strength of the resonance agree with existing theory at electron densities \ensuremath{\gtrsim}${10}^{12}$/${\mathrm{cm}}^{2}$. At lower densities, the resonance position is below the predicted value, implying a substantial increase in the electron mass.
Keywords
PlasmonInversion (geology)Electron densitySiliconPhysicsElectronCondensed matter physicsAtomic physicsResonance (particle physics)Position (finance)Surface plasmon resonanceEffective mass (spring–mass system)Molecular physicsMaterials scienceOpticsQuantum mechanicsOptoelectronics
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Publication Info
- Year
- 1977
- Type
- article
- Volume
- 38
- Issue
- 17
- Pages
- 980-983
- Citations
- 607
- Access
- Closed
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Cite This
S. J. Allen,
D. C. Tsui,
R. A. Logan
(1977).
Observation of the Two-Dimensional Plasmon in Silicon Inversion Layers.
Physical Review Letters
, 38
(17)
, 980-983.
https://doi.org/10.1103/physrevlett.38.980
Identifiers
- DOI
- 10.1103/physrevlett.38.980