Effect of a High-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>κ</mml:mi></mml:math>Environment on Charge Carrier Mobility in Graphene

Л. А. Пономаренко; Rui Yang; Tariq Mohiuddin; M. I. Katsnelson; Kostya S. Novoselov; С. В. Морозов; A. A. Zhukov; F. Schedin; E.W. Hill; A. K. Geǐm

doi:10.1103/physrevlett.102.206603

Abstract

It is widely assumed that the dominant source of scattering in graphene is charged impurities in a substrate. We have tested this conjecture by studying graphene placed on various substrates and in high-kappa media. Unexpectedly, we have found no significant changes in carrier mobility either for different substrates or by using glycerol, ethanol, and water as a top dielectric layer. This suggests that Coulomb impurities are not the scattering mechanism that limits the mean free path attainable for graphene on a substrate.

Keywords

GrapheneSubstrate (aquarium)Charge (physics)ScatteringDynamic light scatteringImpurityCoulombMaterials scienceCharge carrierPhysicsDielectricCondensed matter physicsAnalytical Chemistry (journal)Quantum mechanicsNanotechnologyOptoelectronicsChemistryNanoparticleOrganic chemistry

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Publication Info

Year: 2009
Type: article
Volume: 102
Issue: 20
Pages: 206603-206603
Citations: 378
Access: Closed

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APA Style

                            
                                
                                    Л. А. Пономаренко, 
                                
                                    Rui Yang, 
                                
                                    Tariq Mohiuddin
                                
                                et al.
                            
                            (2009). 
                            Effect of a High-<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mi>κ</mml:mi></mml:math>Environment on Charge Carrier Mobility in Graphene. 
                            Physical Review Letters
                            , 102
                            (20)
                            , 206603-206603.
                            https://doi.org/10.1103/physrevlett.102.206603
                        

Identifiers

DOI: 10.1103/physrevlett.102.206603