Abstract

Abstract Photoelectron spectra of a number of chromium oxides and other compounds were studied under high spectral resolution conditions chosen to reduce the possibility of differential charging. Some of the suite of Cr(III) compounds chosen for study produced Cr 2p spectra containing fine structure that could be identified with multiplet splitting. The splitting patterns produced were similar for all trivalent binary and ternary oxides and sulphides whose patterns closely reproduced the splitting predicted for the Cr(III) free ion by Gupta and Sen. The fine structure observed for compounds such as chromium (III) chloride had a distinctly different pattern. A number of other chromium (III) compounds were studied that did not exhibit the fine structure described above; nonetheless, well‐defined line shapes and reproducible peak centroids were obtained by fitting protocols. The use of such information to determine surface chemistry on chromated steels is described, based on the spectral knowledge of chromium (III) oxides and hydroxides and the chromium (VI) oxide systems. Copyright © 2004 John Wiley & Sons, Ltd.

Keywords

ChromiumX-ray photoelectron spectroscopyTernary operationChemistrySpectral lineChlorideOxideIonInorganic chemistryAnalytical Chemistry (journal)CrystallographyNuclear magnetic resonancePhysicsOrganic chemistry

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Year
2004
Type
article
Volume
36
Issue
12
Pages
1550-1563
Citations
522
Access
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Mark C. Biesinger, Carolyn J. Brown, J.R. Mycroft et al. (2004). X‐ray photoelectron spectroscopy studies of chromium compounds. Surface and Interface Analysis , 36 (12) , 1550-1563. https://doi.org/10.1002/sia.1983

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DOI
10.1002/sia.1983