Abstract
Abstract By using modern XPS systems it is possible to obtain spectra with well‐resolved spin orbit, multiplet and field splitting even with powder samples mounted using adhesive tape. Measurement of Cr 2 O 3 powder with the latest generation of XPS spectrometers, which are able to analyse non‐conductive powders with ultimate energy resolution, revealed multiplet splitting features and satellite emission in the Cr 2p spectrum. Therefore, peak‐fit analysis of Cr 2p XPS spectra of Cr(III) compounds requires a more appropriate approach and common practice has to be reconsidered. One possible way to analyse this spectrum is proposed, based on the experimental and theoretical work of other authors. Copyright © 2004 John Wiley & Sons, Ltd.
Keywords
X-ray photoelectron spectroscopySpectral lineMultipletAnalytical Chemistry (journal)SpectrometerSatelliteMaterials scienceX-rayChemistryNuclear magnetic resonancePhysicsOptics
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Publication Info
- Year
- 2004
- Type
- article
- Volume
- 36
- Issue
- 1
- Pages
- 92-95
- Citations
- 101
- Access
- Closed
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Ercan Ünveren,
Erhard Kemnitz,
Simon Hutton
et al.
(2004).
Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr <sub>2</sub> O <sub>3</sub> powder sample prepared with adhesive tape.
Surface and Interface Analysis
, 36
(1)
, 92-95.
https://doi.org/10.1002/sia.1655
Identifiers
- DOI
- 10.1002/sia.1655