Keywords

Materials scienceHot isostatic pressingThermal expansionSofteningGraphiteMAX phasesFabricationBrittlenessPhase (matter)Solid solutionCharacterization (materials science)Deformation (meteorology)Atmospheric temperature rangeNitrideAnalytical Chemistry (journal)MetallurgyComposite materialMicrostructureNanotechnologyThermodynamicsCarbideChemistry

Affiliated Institutions

Related Publications

Thin Film Transistors : Materials and Processes

1 Introduction.- 1. Brief History of Thin Film Transistors.- 2. a-Si:H TFT LCDs.- 3. Unique a-Si:H TFT Issues.- 4. Chapter Flow in the Book.- References.- 2 a-Si:H TFT Thin Film...

2003 CERN Document Server (European Organi... 77 citations

Publication Info

Year
2000
Type
article
Volume
31
Issue
7
Pages
1857-1865
Citations
546
Access
Closed

External Links

Social Impact

Social media, news, blog, policy document mentions

Citation Metrics

546
OpenAlex

Cite This

Michel W. Barsoum, T. El‐Raghy, M. Ali (2000). Processing and characterization of Ti2AlC, Ti2AlN, and Ti2AlC0.5N0.5. Metallurgical and Materials Transactions A , 31 (7) , 1857-1865. https://doi.org/10.1007/s11661-006-0243-3

Identifiers

DOI
10.1007/s11661-006-0243-3