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Materials sciencePartial pressureWork functionCrystalliteDopingFermi levelImpurityAcceptorElectronAtmospheric temperature rangeAnalytical Chemistry (journal)OxygenCondensed matter physicsLayer (electronics)NanotechnologyChemistryThermodynamicsMetallurgyOptoelectronicsPhysics
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Publication Info
- Year
- 1984
- Type
- article
- Volume
- 19
- Issue
- 7
- Pages
- 2121-2135
- Citations
- 8
- Access
- Closed
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Cite This
P. Odier,
J. C. Rifflet,
J.P. Loup
(1984).
Electron emission measurements and the defect structure of ?-Al2O3.
Journal of Materials Science
, 19
(7)
, 2121-2135.
https://doi.org/10.1007/bf01058088
Identifiers
- DOI
- 10.1007/bf01058088