Abstract
Testing complex manufacturing systems, like the ASML TWINSCAN [2] lithographic\nmachine, takes a lot of time and costs. Within the Tangram project,\nmethods are investigated to reduce this test costs. In this article, we describe\na method which is used to optimize a test sequence such that it takes the least\namount of costs, or time. With several cases we demonstrate that this method\ncan be used to optimize test sequences within the manufacturing of a TWINSCAN\nlithographic machine such that cycle time is reduced.
Keywords
Affiliated Institutions
Related Publications
Guidelines for performing Mendelian randomization investigations
<ns4:p>This paper provides guidelines for performing Mendelian randomization investigations. It is aimed at practitioners seeking to undertake analyses and write up their findin...
A cautionary note on the detection of method variance in multitrait-multimethod data.
Method variance in multitrait-multimethod (MTMM) data is often assessed by comparing the monomethod-heterotrait correlations to the heteromethod-hereotrait correlations in the M...
Structural Equation Modeling with LISREL: Essentials and Advances.
Hayduk is equally at ease explaining the simplest and most advanced applications of the program ...Hayduk has written more than just a solid text for use in advanced graduate co...
Meta-Analysis: Cumulating Research Findings across Studies
Meta-analysis is a way of synthesizing previous research on a subject in order to assess what has already been learned, and even to derive new conclusions from the mass of alrea...
Publication Info
- Year
- 1978
- Type
- article
- Volume
- 36
- Issue
- 4
- Pages
- 405-417
- Citations
- 598
- Access
- Closed
External Links
Social Impact
Social media, news, blog, policy document mentions
Citation Metrics
Cite This
Identifiers
- DOI
- 10.1037//0022-3514.36.4.405