Electron energy loss spectroscopy studies of the Si-SiO2 interface
We have performed, for the first time, measurements of the electronic structure of the Si-SiO2 interface with electron energy loss spectroscopy (ELS) in connection with argon-io...
Publications
1 shownFrequent Co-Authors
Researcher Info
- h-index
- 1
- Publications
- 1
- Citations
- 24
- Institution
- Stanford University
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h-index
1
h-index: Number of publications with at least h citations each.