X-ray diffraction procedures for polycrystalline and amorphous materials

Harold P. Klug; Leroy Alexander

Keywords

CrystalliteAmorphous solidMaterials scienceX-rayDiffractionCrystallographyOpticsPhysicsMetallurgyChemistry

Related Publications

Quantitative x‐ray studies of order in amorphous and crystalline polymers. Quantitative x‐ray determination of crystallinity in polyethylene

S. Krimm , A. V. Tobolsky

Abstract Various quantitative scattering relationships for polymers have been examined experimentally in order to test their validity as assumptions in the x‐ray determination o...

1951 Journal of Polymer Science 203 citations

The Preparation of Amorphous Ni-Zr Powder by Grinding the Crystalline Alloy

A.W. Weeber , H. Bakker , F.R. de Boer

Amorphous Ni61Zr39 powder was prepared by grinding the two-phase crystalline alloy with a nominal composition of 61 at.% Ni and 39 at.% Zr. The X-ray diffraction pattern, the cr...

1986 Europhysics Letters (EPL) 54 citations

Electrochemical and Structural Properties of xLi2M‘O3·(1−x)LiMn0.5Ni0.5O2 Electrodes for Lithium Batteries (M‘ = Ti, Mn, Zr; 0 ≤ x ⩽ 0.3)

Jeom-Soo Kim , Christopher S. Johnson , John T. Vaughey +4 more

Electrochemical and structural properties of xLi2M′O 3·(1-x)LiMn0.5Ni0.5O2 electrodes (M′ = Ti, Mn, Zr; 0 ≤ x ≤ 0.3) for lithium batteries are reported. Powder X-ray diffraction...

2004 Chemistry of Materials 501 citations

Simulated Annealing in Crystallography

Axel T. Brünger

X-ray crystallography (see Refs. 1 , 2 for reviews) is an increasingly impor tant tool for understanding structure, function, and control of biological macromolecules. Developm...

1991 Annual Review of Physical Chemistry 107 citations

Electronic structure and transport properties in the transparent amorphous oxide semiconductor<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"><mml:mn>2</mml:mn><mml:mi/><mml:mi mathvariant="normal">CdO</mml:mi><mml:mi>⋅</mml:mi><mml:mrow><mml:msub><mml:mrow><mml:mi mathvariant="normal">GeO</mml:mi></mml:mrow><mml:mrow><mml:mn>2</mml:mn></mml:mrow></mml:msub></mml:mrow></mml:math>

S. Narushima , Masahiro Orita , Masahiro Hirano +1 more

An amorphous $2\mathrm{CdO}\ensuremath{\cdot}{\mathrm{GeO}}_{2}$ thin film with a band gap of 3.4 eV can be converted from an insulator (conductivity $\ensuremath{\sim}{10}^{\en...

2002 Physical review. B, Condensed matter 84 citations

Publication Info

Year: 1954
Type: book
Citations: 6007
Access: Closed

External Links

Citation Metrics

6007

OpenAlex

Cite This

APA Style

                            
                                    Harold P. Klug, 
                                
                                    Leroy Alexander
                                
                            (1954). 
                            X-ray diffraction procedures for polycrystalline and amorphous materials. 
                            
                            .