X-ray and electron microscopy studies of single-layer TaS2 and NbS2

C. Liu; O. Singh; P. Joensen; A.E. Curzon; R. F. Frindt

doi:10.1016/0040-6090(84)90025-7

Keywords

Intercalation (chemistry)CrystallographySuperlatticeDiffractionMaterials scienceTransmission electron microscopyLayer (electronics)Electron diffractionStackingElectron microscopeAnalytical Chemistry (journal)X-ray crystallographyReflection high-energy electron diffractionCharge density waveChemistryOpticsNanotechnologyCondensed matter physicsInorganic chemistryOptoelectronics

Affiliated Institutions

Simon Fraser University CA

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Publication Info

Year: 1984
Type: article
Volume: 113
Issue: 2
Pages: 165-172
Citations: 45
Access: Closed

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APA Style

                            
                                
                                    C. Liu, 
                                
                                    O. Singh, 
                                
                                    P. Joensen
                                
                                et al.
                            
                            (1984). 
                            X-ray and electron microscopy studies of single-layer TaS2 and NbS2. 
                            Thin Solid Films
                            , 113
                            (2)
                            , 165-172.
                            https://doi.org/10.1016/0040-6090(84)90025-7
                        

Identifiers

DOI: 10.1016/0040-6090(84)90025-7