Abstract

Thermal processes may limit the lifetime of stored data and ultimately the achievable areal density in magnetic recording. To quantify this important problem, we have studied a series of state-of-the-art thin film CoPtCr longitudinal recording media samples with thicknesses ranging between 5.5 and 13 nm. Static write/read tester experiments are used to measure the remanent coercivity of these films as a function of the applied magnetic field pulse width, which is varied in the range of nanoseconds to seconds. The data are analyzed in terms of an inverse slope parameter, 1/C, which in the framework of a Neel-Arrhenius model is equivalent to the familiar stability ratio EB/kBT. This ratio is then correlated with signal decay measurements, performed over a time range after writing of 2.8 s to ≈1 day. Both measurements are carried out at variable temperatures, T, between 300 and 390 K. The onset of strong signal decay in low density square wave bit patterns occurs when 1/C drops below about 36.

Keywords

CoercivityMaterials scienceNanosecondCondensed matter physicsArea densityThermal stabilityRange (aeronautics)Heat-assisted magnetic recordingNuclear magnetic resonanceComputational physicsOpticsPhysicsComposite materialAcoustics

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2001 Annual Review of Materials Research 751 citations

Publication Info

Year
1999
Type
article
Volume
75
Issue
11
Pages
1604-1606
Citations
17
Access
Closed

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Cite This

A. Moser, D. Weller, M. Doerner (1999). Thermal stability of longitudinal magnetic recording media. Applied Physics Letters , 75 (11) , 1604-1606. https://doi.org/10.1063/1.124768

Identifiers

DOI
10.1063/1.124768

Data Quality

Data completeness: 77%