Abstract
Thermal processes may limit the lifetime of stored data and ultimately the achievable areal density in magnetic recording. To quantify this important problem, we have studied a series of state-of-the-art thin film CoPtCr longitudinal recording media samples with thicknesses ranging between 5.5 and 13 nm. Static write/read tester experiments are used to measure the remanent coercivity of these films as a function of the applied magnetic field pulse width, which is varied in the range of nanoseconds to seconds. The data are analyzed in terms of an inverse slope parameter, 1/C, which in the framework of a Neel-Arrhenius model is equivalent to the familiar stability ratio EB/kBT. This ratio is then correlated with signal decay measurements, performed over a time range after writing of 2.8 s to ≈1 day. Both measurements are carried out at variable temperatures, T, between 300 and 390 K. The onset of strong signal decay in low density square wave bit patterns occurs when 1/C drops below about 36.
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Publication Info
- Year
- 1999
- Type
- article
- Volume
- 75
- Issue
- 11
- Pages
- 1604-1606
- Citations
- 17
- Access
- Closed
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Identifiers
- DOI
- 10.1063/1.124768