Keywords

Reliability (semiconductor)ElectroencephalographyEvent (particle physics)StatisticsVariance (accounting)PsychologyComputer sciencePower (physics)MathematicsPhysics

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Publication Info

Year
1996
Type
article
Volume
23
Issue
3
Pages
163-169
Citations
26
Access
Closed

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26
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Adrian Burgess, John Gruzelier (1996). The reliability of event-related desynchronisation: a generalisability study analysis. International Journal of Psychophysiology , 23 (3) , 163-169. https://doi.org/10.1016/s0167-8760(96)00046-3

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DOI
10.1016/s0167-8760(96)00046-3