Abstract

A simple optical method is presented for identifying and measuring the effective optical properties of nanometer-thick, graphene-based materials, based on the use of substrates consisting of a thin dielectric layer on silicon. High contrast between the graphene-based materials and the substrate is obtained by choosing appropriate optical properties and thickness of the dielectric layer. The effective refractive index and optical absorption coefficient of graphene oxide, thermally reduced graphene oxide, and graphene are obtained by comparing the predicted and measured contrasts.

Keywords

GrapheneCharacterization (materials science)NanotechnologySimple (philosophy)Materials scienceContrast (vision)Optical imagingHigh contrastOptoelectronicsOpticsPhysics

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Publication Info

Year
2007
Type
article
Volume
7
Issue
12
Pages
3569-3575
Citations
339
Access
Closed

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Cite This

Inhwa Jung, Matthew Pelton, Richard D. Piner et al. (2007). Simple Approach for High-Contrast Optical Imaging and Characterization of Graphene-Based Sheets. Nano Letters , 7 (12) , 3569-3575. https://doi.org/10.1021/nl0714177

Identifiers

DOI
10.1021/nl0714177
arXiv
0706.0029

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Data completeness: 84%