Abstract

The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of ${\mathrm{He}}^{4}$ measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.

Keywords

Quartz crystal microbalanceHeliumAdsorptionQuartzMaterials scienceSuperfluidityCrystal (programming language)Substrate (aquarium)Isotopes of heliumCrystal oscillatorCondensed matter physicsChemical physicsAnalytical Chemistry (journal)Composite materialAtomic physicsPhysicsPhysical chemistryChemistryOptoelectronicsOrganic chemistryResonator

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Publication Info

Year
1972
Type
article
Volume
29
Issue
4
Pages
211-214
Citations
67
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Marvin Chester, Liuchun Yang, J. B. Stephens (1972). Quartz Microbalance Studies of an Adsorbed Helium Film. Physical Review Letters , 29 (4) , 211-214. https://doi.org/10.1103/physrevlett.29.211

Identifiers

DOI
10.1103/physrevlett.29.211