Abstract

Building on the work of Alnaser et al. [Phys. Rev. A 70, 023413 (2004)], we devise an improved method for an in-situ measurement of the peak intensity in a focused, femtosecond infrared laser pulse. The method is shown to be effective with both photoion and photoelectron imaging devices. The model used to fit the experimental data has no unphysical free parameters used in fitting. The accuracy of the fit is 4% and the overall accuracy of the measurement is 8%.

Keywords

OpticsLaserFemtosecondIonizationIntensity (physics)Above threshold ionizationPulse shapingPulse (music)PhysicsMaterials sciencePhotoionizationDetector

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Publication Info

Year
2011
Type
article
Volume
19
Issue
10
Pages
9336-9336
Citations
72
Access
Closed

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Cite This

Christopher Smeenk, Jeff Z. Salvail, Ladan Arissian et al. (2011). Precise in-situ measurement of laser pulse intensity using strong field ionization. Optics Express , 19 (10) , 9336-9336. https://doi.org/10.1364/oe.19.009336

Identifiers

DOI
10.1364/oe.19.009336