Practice and Yield of Early CT Scan in Acute Pancreatitis: A Dutch Observational Multicenter Study

B.W.M. Spanier; Yung Nio; R.W.M. van der Hulst; Hans A.R.E. Tuynman; Marcel G.W. Dijkgraaf; Marco J. Bruno

doi:10.1159/000243731

Keywords

MedicineAcute pancreatitisEtiologyObservational studyPancreatitisEndoscopic retrograde cholangiopancreatographyRadiologyComputed tomographyInternal medicine

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Publication Info

Year: 2010
Type: article
Volume: 10
Issue: 2-3
Pages: 222-228
Citations: 152
Access: Closed

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APA Style

                            
                                
                                    B.W.M. Spanier, 
                                
                                    Yung Nio, 
                                
                                    R.W.M. van der Hulst
                                
                                et al.
                            
                            (2010). 
                            Practice and Yield of Early CT Scan in Acute Pancreatitis: A Dutch Observational Multicenter Study. 
                            Pancreatology
                            , 10
                            (2-3)
                            , 222-228.
                            https://doi.org/10.1159/000243731
                        

Identifiers

DOI: 10.1159/000243731