Abstract
Provides a unified, comprehensive and up-to-date treatment of both statistical and descriptive methods for pattern recognition. The topics treated include Bayesian decision theory, supervised and unsupervised learning, nonparametric techniques, discriminant analysis, clustering, preprosessing of pictorial data, spatial filtering, shape description techniques, perspective transformations, projective invariants, linguistic procedures, and artificial intelligence techniques for scene analysis.
Keywords
Artificial intelligencePattern recognition (psychology)Cluster analysisLinear discriminant analysisComputer sciencePerspective (graphical)Nonparametric statisticsBayesian probabilityCategorizationMachine learningMathematicsStatistics
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Publication Info
- Year
- 1973
- Type
- book
- Citations
- 12643
- Access
- Closed
External Links
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Cite This
Richard O. Duda,
Peter E. Hart
(1973).
Pattern classification and scene analysis.
CERN Document Server (European Organization for Nuclear Research)
.