Optical properties of large-area polycrystalline chemical vapor deposited graphene by spectroscopic ellipsometry

Florence Nelson; Vimal Kamineni; Ting Zhang; Everett Comfort; J. U. Lee; Alain C. Diebold

doi:10.1063/1.3525940

Abstract

Spectroscopic ellipsometry was used to characterize the complex refractive index of chemical vapor deposition (CVD) graphene grown on copper foils and transferred to glass substrates. Two ellipsometers, with respective wavelength ranges extending into the ultraviolet and infrared (IR), have been used to characterize the CVD graphene optical functions. The optical absorption follows the same relation to the fine structure constant previously observed in the IR region, and displays the exciton-dominated absorption peak at ∼4.5 eV. The optical functions of CVD graphene show some differences when compared to published values for exfoliated graphene.

Keywords

GrapheneChemical vapor depositionRefractive indexEllipsometryMaterials scienceAbsorption (acoustics)InfraredUltravioletCrystalliteAnalytical Chemistry (journal)OptoelectronicsThin filmOpticsChemistryNanotechnology

Affiliated Institutions

University at Albany, State University of New York US

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Publication Info

Year: 2010
Type: article
Volume: 97
Issue: 25
Citations: 184
Access: Closed

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APA Style

                            
                                
                                    Florence Nelson, 
                                
                                    Vimal Kamineni, 
                                
                                    Ting Zhang
                                
                                et al.
                            
                            (2010). 
                            Optical properties of large-area polycrystalline chemical vapor deposited graphene by spectroscopic ellipsometry. 
                            Applied Physics Letters
                            , 97
                            (25)
                            .
                            https://doi.org/10.1063/1.3525940
                        

Identifiers

DOI: 10.1063/1.3525940