Keywords
Monocrystalline siliconGraphiteMaterials scienceSiliconLayer (electronics)CrystallographyCrystal (programming language)EvaporationCrystalliteNanotechnologyChemistryMetallurgyPhysicsThermodynamics
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Publication Info
- Year
- 1975
- Type
- article
- Volume
- 48
- Issue
- 2
- Pages
- 463-472
- Citations
- 765
- Access
- Closed
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Cite This
A.J. Van Bommel,
J.E. Crombeen,
A. van Tooren
(1975).
LEED and Auger electron observations of the SiC(0001) surface.
Surface Science
, 48
(2)
, 463-472.
https://doi.org/10.1016/0039-6028(75)90419-7
Identifiers
- DOI
- 10.1016/0039-6028(75)90419-7