Abstract
International audience
Keywords
Discriminative modelArtificial intelligenceRobustness (evolution)Computer sciencePattern recognition (psychology)Similarity (geometry)Metric (unit)Convolutional neural networkFace (sociological concept)Computer visionImage (mathematics)
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Publication Info
- Year
- 2005
- Type
- article
- Volume
- 1
- Pages
- 539-546
- Citations
- 3860
- Access
- Closed
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Cite This
Sumit Chopra,
Raia Hadsell,
Yann LeCun
(2005).
Learning a Similarity Metric Discriminatively, with Application to Face Verification.
, 1
, 539-546.
https://doi.org/10.1109/cvpr.2005.202
Identifiers
- DOI
- 10.1109/cvpr.2005.202