Abstract

Digital signal processors have made it possible to control scanned probe microscopes using straightforward software emulations of analog circuits. Using a system consisting of a commercially available digital signal processor board interfaced to analog I/O, we have developed algorithms for self-optimizing feedback, raster generation (with hysteresis correction, sample tilt compensation, and scan rotation), lock-in detection, and automatic tip-sample approach. We also discuss an instruction parser that takes advantage of the digital architecture to allow automatic operation for extended periods.

Keywords

Computer scienceDigital signal processorRaster graphicsComputer hardwareSIGNAL (programming language)MicroscopeSample (material)Rotation (mathematics)Digital signal processingRaster scanAnalog signalCompensation (psychology)SoftwareDigital signalOpticsArtificial intelligence

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Publication Info

Year
1993
Type
article
Volume
64
Issue
7
Pages
1874-1882
Citations
32
Access
Closed

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David R. Baselt, Steven M. Clark, M. G. Youngquist et al. (1993). Digital signal processor control of scanned probe microscopes. Review of Scientific Instruments , 64 (7) , 1874-1882. https://doi.org/10.1063/1.1144462

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DOI
10.1063/1.1144462