Abstract
This paper describes diffraction-pattern sampling as a basis for automatic pattern recognition in photographic imagery; it covers: Diffraction-pattern generation. diffraction-pattern/image-area relationships, diffraction-pattern sampling, algorithm development (using an interactive computer-graphic based facility), facility description, and experimental results which have been obtained over the last few years at General Motors’ AC Electronics-Defense Research Laboratories, Santa Barbara, Calif. Sampling the diffraction pattern results in a sample signature–a different one for each sampling geometry. The kinds of information obtainable from sample signatures are described, and considerations for developing algorithms based on such information are discussed. A tutorial section is included for the purpose of giving the reader an intuitive feeling for the kinds of information contained in a diffraction pattern and how it relates to the original photographic imagery. © 1970, IEEE. All rights reserved.
Keywords
DiffractionSampling (signal processing)Sample (material)Computer scienceSignature (topology)Pattern recognition (psychology)Artificial intelligenceComputer visionOpticsMathematicsGeometryPhysics
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Publication Info
- Year
- 1970
- Type
- article
- Volume
- 58
- Issue
- 2
- Pages
- 198-216
- Citations
- 196
- Access
- Closed
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Cite This
George G. Lendaris,
Gordon L. Stanley
(1970).
Diffraction-pattern sampling for automatic pattern recognition.
Proceedings of the IEEE
, 58
(2)
, 198-216.
https://doi.org/10.1109/proc.1970.7593
Identifiers
- DOI
- 10.1109/proc.1970.7593