Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction

Keywords

Porous siliconLattice constantDiffractometerPorosityMaterials scienceSiliconDiffractionPorous mediumLattice (music)CurvatureCrystallographyX-ray crystallographySubstrate (aquarium)Crystal structureComposite materialOpticsChemistryGeometryScanning electron microscopeMetallurgyPhysicsGeologyMathematics

Affiliated Institutions

Institut Laue-Langevin FR

Related Publications

The diffraction of X-rays by distorted-crystal aggregates. II. Diffraction by bent lamellae

A. J. C. Wilson

The apparent particle size of distorted crystallites varies from independence of θ and λ (particle-size broadening) to proportionality with λ cosec θ (distortion broadening) as ...

1949 Acta Crystallographica 13 citations

XPS and STM Investigation of the Passive Film Formed on Cr(110) Single‐Crystal Surfaces

Vincent Maurice , Wenjie Yang , Philippe Marcus

A combined ex situ x‐ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM) investigation of the passive films formed on Cr(110) single‐crystal surfaces in...

1994 Journal of The Electrochemical Society 160 citations

Publication Info

Year: 1984
Type: article
Volume: 68
Issue: 3
Pages: 727-732
Citations: 225
Access: Closed

External Links

View on DOI.org

Social Impact

Altmetric

Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction

PlumX Metrics

Social media, news, blog, policy document mentions

Citation Metrics

225

OpenAlex

Cite This

APA Style

                            
                                
                                    K. Barla, 
                                
                                    R. Hérino, 
                                
                                    G. Bomchil
                                
                                et al.
                            
                            (1984). 
                            Determination of lattice parameter and elastic properties of porous silicon by X-ray diffraction. 
                            Journal of Crystal Growth
                            , 68
                            (3)
                            , 727-732.
                            https://doi.org/10.1016/0022-0248(84)90111-8
                        

Identifiers

DOI: 10.1016/0022-0248(84)90111-8