Abstract

We report on the application of the atomic force microscope (AFM) to manipulate and position nanometer-sized particles with nanometer precision. The technique, which can be regarded as a nanometer-scale analogy to atomic level manipulation with the scanning tunneling microscope, allowed us to form arbitrary nanostructures, under ambient conditions, by controlled manipulation of individual 30 nm GaAs particles. A whole new set of nanodevices can be fabricated particle-by-particle for studies of quantum effects and single electron tunneling. We also demonstrate a method, based on the AFM manipulation, to determine the true lateral dimensions of nano-objects, in spite of the tip-sample convolution.

Keywords

NanometreNanotechnologyScanning tunneling microscopeMicroscopeParticle (ecology)NanostructureMaterials scienceQuantum tunnellingAtomic force microscopyElectron microscopeConductive atomic force microscopyOptoelectronicsOpticsPhysics

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Publication Info

Year
1995
Type
article
Volume
66
Issue
26
Pages
3627-3629
Citations
456
Access
Closed

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Cite This

T. Junno, Knut Deppert, Lars Montelius et al. (1995). Controlled manipulation of nanoparticles with an atomic force microscope. Applied Physics Letters , 66 (26) , 3627-3629. https://doi.org/10.1063/1.113809

Identifiers

DOI
10.1063/1.113809