Abstract
The design of a computer system which directly controls tunnel barrier width in a scanning tunneling microscope (STM) is described. This capability allows STM scans to be performed at a speed which is automatically determined by the roughness of the surface under study. The computer system is inexpensive and designed with readily available components for the VME bus.
Keywords
Scanning tunneling microscopeQuantum tunnellingSurface finishMicroscopeMaterials scienceVMEbusOpticsSurface roughnessTunnel junctionComputer scienceOptoelectronicsNanotechnologyPhysicsData acquisitionComposite materialOperating system
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Publication Info
- Year
- 1989
- Type
- article
- Volume
- 60
- Issue
- 10
- Pages
- 3123-3127
- Citations
- 97
- Access
- Closed
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Cite This
Richard D. Piner,
R. Reifenberger
(1989).
Computer control of the tunnel barrier width for the scanning tunneling microscope.
Review of Scientific Instruments
, 60
(10)
, 3123-3127.
https://doi.org/10.1063/1.1140589
Identifiers
- DOI
- 10.1063/1.1140589