Atom inlays performed at room temperature using atomic force microscopy

Yoshiaki Sugimoto; Masayuki Abe; Shinji Hirayama; Noriaki Oyabu; Óscar Custance; Seizo Morita

doi:10.1038/nmat1297

Keywords

NanoengineeringAtom (system on chip)Materials scienceScanning tunneling microscopeAtomic force microscopyNanotechnologyQuantum tunnellingSurface (topology)OptoelectronicsComputer scienceGeometry

Affiliated Institutions

The University of Osaka JP

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Publication Info

Year: 2005
Type: article
Volume: 4
Issue: 2
Pages: 156-159
Citations: 375
Access: Closed

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APA Style

                            
                                
                                    Yoshiaki Sugimoto, 
                                
                                    Masayuki Abe, 
                                
                                    Shinji Hirayama
                                
                                et al.
                            
                            (2005). 
                            Atom inlays performed at room temperature using atomic force microscopy. 
                            Nature Materials
                            , 4
                            (2)
                            , 156-159.
                            https://doi.org/10.1038/nmat1297
                        

Identifiers

DOI: 10.1038/nmat1297