Keywords
Technology acceptance modelReliability (semiconductor)Construct (python library)PsychologyUsabilityConstruct validitySocial psychologyFunction (biology)Criterion validityComputer scienceCognitive psychologyStatisticsPsychometricsHuman–computer interactionMathematicsDevelopmental psychology
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Publication Info
- Year
- 1996
- Type
- article
- Volume
- 45
- Issue
- 1
- Pages
- 19-45
- Citations
- 1336
- Access
- Closed
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Cite This
Fred D. Davis,
Viswanath Venkatesh
(1996).
A critical assessment of potential measurement biases in the technology acceptance model: three experiments.
International Journal of Human-Computer Studies
, 45
(1)
, 19-45.
https://doi.org/10.1006/ijhc.1996.0040
Identifiers
- DOI
- 10.1006/ijhc.1996.0040