Federal Institute For Materials Research and Testing

Publications

Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr 2 O 3 powder sample prepared with adhesive tape

Ercan Ünveren , Erhard Kemnitz , Simon Hutton +2 more

Abstract By using modern XPS systems it is possible to obtain spectra with well‐resolved spin orbit, multiplet and field splitting even with powder samples mounted using adhesiv...

2004 Surface and Interface Analysis 101 citations

Curve fitting of Cr 2p photoelectron spectra of Cr 2 O 3 and CrF 3

I. Grohmann , Erhard Kemnitz , Andreas Lippitz +1 more

Abstract Chromium (III) 2p photoelectron spectra show strong satellites on the high‐binding‐energy side of the main photoelectron peaks. In the case of Cr 2p spectra, the satell...

1995 Surface and Interface Analysis 91 citations

X-Ray Photoelectron and X-Ray Excited Auger Electron Spectroscopic Analysis of Surface Modifications of Chromia during Heterogeneous Catalyzed Chlorine/Fluorine Exchange

Erhard Kemnitz , A. Kohne , I. Grohmann +2 more

1996 Journal of Catalysis 61 citations

Affiliated Researchers

Institution Info

Type: facility
Country: DE
Publications: 3
Citations: 253

External Links

Identifiers

ROR: https://ror.org/03x516a66

Publications

Analysis of highly resolved x‐ray photoelectron Cr 2p spectra obtained with a Cr <sub>2</sub> O <sub>3</sub> powder sample prepared with adhesive tape

Curve fitting of Cr 2p photoelectron spectra of Cr <sub>2</sub> O <sub>3</sub> and CrF <sub>3</sub>

X-Ray Photoelectron and X-Ray Excited Auger Electron Spectroscopic Analysis of Surface Modifications of Chromia during Heterogeneous Catalyzed Chlorine/Fluorine Exchange

Affiliated Researchers

Ercan Ünveren

Andreas Lippitz

Wolfgang E. S. Unger

Institution Info

External Links

Identifiers