The infrared optical properties of SiO2 and SiO2 layers on silicon
The complex index of refraction N=n−ik for amorphous SiO2 is derived in the energy range 0.03–1.0 eV by Kramers-Kronig analysis of reflectance data. The results are used to comp...
The complex index of refraction N=n−ik for amorphous SiO2 is derived in the energy range 0.03–1.0 eV by Kramers-Kronig analysis of reflectance data. The results are used to comp...
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